Nuclear Physics and Atomic Energy

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Nuclear Physics and Atomic Energy

  ISSN: 1818-331X (Print), 2074-0565 (Online)
  Publisher: Institute for Nuclear Research of the National Academy of Sciences of Ukraine
  Languages: Ukrainian, English
  Periodicity: 4 times per year

  Open access peer reviewed journal


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Nucl. Phys. At. Energy 2024, volume 25, issue 3, pages 289-297.
Section: Engineering and Methods of Experiment.
Received: 19.06.2024; Accepted: 28.08.2024; Published online: 27.09.2024.
PDF Full text (en)
https://doi.org/10.15407/jnpae2024.03.289

Performance and application of scanning nuclear microprobe at the Institute of Applied Physics of the National Academy of Sciences of Ukraine

A. G. Ponomarev*, S. V. Kolinko, V. A. Rebrov, D. V. Magilin, I. H. Ihnatiev, V. I. Voznyi, V. F. Salivon

Institute of Applied Physics, National Academy of Sciences of Ukraine, Sumy, Ukraine

*Corresponding author. E-mail address: ponom56@gmail.com

Abstract: The scanning nuclear microprobe of the Institute of Applied Physics of the National Academy of Sciences of Ukraine is an analytical channel based on the compact electrostatic accelerator "Sokol" of the Van de Graaff type with the maximum voltage at the high-voltage terminal of 2 MV and is designed for local non-destructive analysis of samples of various origins with high sensitivity (~1 ppm), as well as for the fabrication of three-dimensional small structures of high quality using proton beam writing. The resolution of the microprobe is about 3 μm with a beam current of I ~ 100 pA and 0.6 μm with I ~1 pA. The maximum scanning raster with a focused beam on the sample surface is 1 × 1 mm2. The microprobe implements the techniques of particle-induced X-ray emission, Rutherford backscattering, and secondary electron microscopy. The article also gives examples of the use of the nuclear microprobe in physical research.

Keywords: electrostatic accelerator, scanning nuclear microprobe, probe forming system, proton beam writing, X-ray diffraction grating, quadrupole magnetic lens, particle-induced X-ray emission, Rutherford backscattering.

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